https://doi.org/10.1140/epjp/s13360-023-04397-0
Regular Article
Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs
1
CERN, 1211, Esplanade des Particules 1 Geneva, 23, Geneva, Switzerland
2
Dipartimento di Fisica e Astronomia ”A. Righi”, University of Bologna, viale Carlo Berti Pichat 6/2, 40127, Bologna, Italy
3
Sezione di Bologna, Istituto Nazionale di Fisica Nucleare, viale Carlo Berti Pichat 6/2, 40127, Bologna, Italy
4
Dipartimento di elettronica e telecomunicazioni, Politecnico di Torino, Corso Duca degli Abruzzi, 24, 10129, Torino, Italy
5
Fondazione Bruno Kessler, Via Sommarive, 18, 38123, Povo, Italy
6
Museo Storico della Fisica e Centro Studi Enrico Fermi, Via Panisperna 89 A, 10129, Rome, Italy
7
Dipartmento di Fisica, University of Salerno, Via Giovanni Paolo II, 132, 84084, Salerno, Italy
a
francesca.carnesecchi@cern.ch
Received:
31
May
2023
Accepted:
18
August
2023
Published online:
5
September
2023
In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligible. This study also allowed us to study the time resolution of such devices as a function of the number of firing cells, reaching values below 20 ps. These measurements provide significant insight into the capabilities of SiPM sensors in direct detection of charged particles and their potential for several applications.
B. Sabiu: Now at ICSC, World Laboratory, c\o CERN Geneva.
G. Vignola: Now at Deutsches Elektronen-Synchrotron DESY, Hamburg.
© The Author(s) 2023
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