https://doi.org/10.1140/epjp/s13360-023-03923-4
Regular Article
Understanding the direct detection of charged particles with SiPMs
1
CERN, 1210, Geneva 23, Switzerland
2
Sezione di Bologna, Istituto Nazionale di Fisica Nucleare, Viale Carlo Berti Pichat 6/2, 40127, Bologna, Italy
3
Dipartmento di Fisica e Astronomia “A. Righi”, University of Bologna, Viale Carlo Berti PIchat 6/2, 40127, Bologna, Italy
4
Dipartimento di elettronica e comunicazioni, Politecnico di Torino, Corso Duca degli Abruzzi, 24, 40127, Torino, Italy
5
Fondazione Bruno Kessler, Via Sommarive, 18, 38123, Povo, Italy
6
Museo Storico della Fisica e Centro Studi Enrico Fermi, Via Panisperna 89 A, 10129, Roma, Italy
7
Dipartmento di Fisica, University of Salerno, Via Giovanni Paolo II, 132, 84084, Salerno, Italy
8
Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany
a
francesca.carnesecchi@cern.ch
b
gianpiero.vignola@desy.de
Received:
12
November
2022
Accepted:
21
March
2023
Published online:
18
April
2023
In this paper, evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.
Focus Point on Silicon-based Detectors for Nuclear, High-Energy and Astroparticle Physics. Guest editors: E. Scapparone, G. Scioli.
© The Author(s) 2023
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