https://doi.org/10.1140/epjp/s13360-023-03700-3
Correction
Correction to: Application of a MA-XRF/RIS/PL scanner to paintwork studies
1
The Cyprus Institute, 2121, Aglantzia, Cyprus
2
Centre de Recherche et de Restauration des Musées de France, C2RMF, 75001, Paris, France
3
Fondation des Sciences du Patrimoine, ANR-17-EUR-0021, 95000, Cergy, France
4
Fédération de Recherche FR3506 New AGLAE, 75001, Paris, France
5
Chimie ParisTech, CNRS, Instistut de Recherche de Chimie de Paris (IRCP), UMR8247, PSL University, 75005, Paris, France
This article has no abstract.
The original article can be found online at https://doi.org/10.1140/epjp/s13360-022-03604-8.
© The Author(s), under exclusive licence to Società Italiana di Fisica and Springer-Verlag GmbH Germany, part of Springer Nature 2023