https://doi.org/10.1140/epjp/s13360-023-03700-3
Correction
Correction to: Application of a MA-XRF/RIS/PL scanner to paintwork studies
1
The Cyprus Institute, 2121, Aglantzia, Cyprus
2
Centre de Recherche et de Restauration des Musées de France, C2RMF, 75001, Paris, France
3
Fondation des Sciences du Patrimoine, ANR-17-EUR-0021, 95000, Cergy, France
4
Fédération de Recherche FR3506 New AGLAE, 75001, Paris, France
5
Chimie ParisTech, CNRS, Instistut de Recherche de Chimie de Paris (IRCP), UMR8247, PSL University, 75005, Paris, France
This article has no abstract.
© The Author(s), under exclusive licence to Società Italiana di Fisica and Springer-Verlag GmbH Germany, part of Springer Nature 2023