https://doi.org/10.1140/epjp/i2016-16089-3
Regular Article
Effect of annealing temperature on morphological, structural and optical properties of nanostructured CuO thin film
Department of Physics, Faculty of Science, Firat University, 23119, Elazig, Turkey
* e-mail: uakgul@firat.edu.tr
Received:
14
December
2015
Accepted:
6
February
2016
Published online:
12
April
2016
CuO thin film was grown on a glass substrate by reactive radio frequency (rf) magnetron sputtering. The deposited film was annealed in air at various temperatures for 2h. The SEM images showed that the grain size increased with rising annealing temperature. The EDX and XRD results revealed that the chemical composition and phase of the polycrystalline film were not affected by the annealing conditions. The optical band gap increased from 2.244eV to 2.261eV and then decreased from 2.261eV to 2.145eV by the effect of annealing temperature.
© Società Italiana di Fisica and Springer-Verlag Berlin Heidelberg, 2016
