https://doi.org/10.1140/epjp/s13360-020-00916-5
Regular Article
A new model of thermionic emission mechanism for non-ideal Schottky contacts and a method of extracting electrical parameters
1
Laboratoire de Microélectronique Appliquée, Université de Sidi Bel Abbès, BP 89, 22000, Sidi Bel Abbes, Algeria
2
IUMA, Institute for Applied Microelectronics, Universidad de Las Palmas de Gran Canaria, Edificio de Electrónica y Telecomunicación, Campus Universitario de Tafira, 35017, Las Palmas, Spain
3
Unité de recherche Matériaux Avancés et Nanotechnologies (URMAN), Institut Supérieur des Sciences Appliquées et de Technologie de Kasserine, Université de Kairouan, BP 471, 1200, Kasserine, Tunisia
4
Laboratory of Physics of Materials and Nanomaterials Applied to the Environment, Faculty of Sciences of Gabes, University of Gabes, 6079, Erriadh City, Gabès, Tunisia
5
Université Clermont Auvergne, CNRS, SIGMA Clermont, Institut Pascal, 63000, Clermont-Ferrand, France
Received:
25
August
2020
Accepted:
4
November
2020
Published online:
10
November
2020
In this paper, a new model of thermionic emission current for non-ideal Schottky contacts and a method of extracting electrical parameters are presented. The Au/n-GaAs Schottky structure is fabricated and simulated using Silvaco–Atlas software in a wide temperature range. The proposed method shows series resistance values close to those obtained from ln(I)–V method and ideality factor n in good agreement with the reported experimental studies. The barrier height
extracted by our method is in good agreement with those extracted from the band diagram (BD) and capacitance–voltage (C–V) characteristics. It is increased with decreasing temperature, in accordance with the band gap variation with temperature and the reported negative temperature coefficient of the barrier height. Conversely,
obtained from the classical model using ln(I)–V method shows an abnormal behavior and discordance with the
extracted from the band diagram and C–V characteristics. Finally, the proposed model shows identical characteristics with the simulation and the experimental curves, in all temperature range, while the classic model shows large deviations at high bias voltages.
© Società Italiana di Fisica and Springer-Verlag GmbH Germany, part of Springer Nature 2020