https://doi.org/10.1140/epjp/i2019-12652-8
Regular Article
Characterization and setting protocol for a simultaneous X-ray Diffraction - X-ray Fluorescence system (XRD/XRF) for in situ analysis
1
Instituto de Física, Universidad Nacional Autónoma de México, Universidad Av. 3000, 04510, Mexico City, Mexico
2
Centro de Física Aplicada y Tecnología Avanzada, Universidad Nacional Autónoma de México, Universidad Nacional Autonoma de México, A.P. 1-1010, 76000, Queretaro, Mexico
* e-mail: sil@fisica.unam.mx
** e-mail: joseluis.ruvalcaba@gmail.com
Received:
23
January
2019
Accepted:
25
March
2019
Published online:
25
June
2019
A simultaneous XRD/XRF device was set to perform non-invasive and in situ analyses. It has a curved position-sensitive detector (CPS) for X-ray Diffraction (XRD), with a 180mm radius and a 
range with a reflection mode asymmetric geometry, and with an additional SDD detector for simultaneous X-ray Fluorescence analyses (XRF). This device allows the use of two different configurations: one for powder samples and objects smaller than 200mm, and another for larger flat objects (e.g. paintings). This work presents the design, optical features and characterization of the system, as well as some examples of successful XRD identification in solid samples using XRF data with analysis by diffraction in situ (ADIS). The reliability of this system for crystalline phase identification was tested with a 
position, profile shape and intensity evaluation, using different reference materials. In addition, this device was compared with portable XRD-XRF systems and two laboratory XRD devices.
© Società Italiana di Fisica and Springer-Verlag GmbH Germany, part of Springer Nature, 2019
